crta
Hrvatska znanstvena Sekcija img
bibliografija
3 gif
 Home
 About the project
 FAQ
 Contact
4 gif
Browsing
Basic search
Advanced search
Statistical data
Other bibliographies
Similar projects
 Catalogues and databases

Bibliographic record number: 364898

Journal

Authors: Risović, Dubravko; Mahović Poljaček, Sanja; Furić, Krešimir; Gojo, Miroslav
Title: Inferring fractal dimension of rough/porous surfaces - a comparison of SEM image analysis and electrochemical impedance spectroscopy methods
Source: Applied Surface Science (0169-4332) 255 (2008), 5 Part 2; 3063-3070
Paper type: article
Keywords: impedance spectroscopy; fractal dimension; surface roughness; gray-scale image; CPE
Abstract:
There are many methods for analysis and description of surface topographies that rely on analysis of surface images obtained by various methods such as SEM or AFM. However, they can seldom provide quantitative topographical information. Such information can be obtained by fractal analysis of the images resulting in a characteristic fractal dimensions. The advantage of fractal approach to surface characterization is that it is insensitive to the structural details, and the structure is characterized by single descriptor, the fractal dimension D. On the other hand, it is well established that electrochemical impedance spectroscopy (EIS) is convenient method often used to infer the fractal dimension of porous or rough surfaces-electrodes. Here we present and discuss the results of comparison of two methods for determination of topological fractal properties of porous/rough surfaces: electrochemical impedance spectroscopy and (SEM) grey-scale image analysis. We have established that in most cases there is a good correlation between the fractal dimensions inferred from EIS measurements (DEIS) and those obtained from fractal analysis of gray scale SEM images (Dg). However, the fractal dimension inferred from gray scale SEM images Dg seems to be a better descriptor of surface topology than the fractal dimension inferred from CPE exponent   of EIS measurements, since the latter may be influenced by other parameters beside pure geometrical surface roughness or porosity. This conclusion is supported with recent finding of good correlation of Dg and relevant different profilometric parameters.
Project / theme: 128-1281957-1958, 098-0982904-2898, 128-1201785-2228, 098-0982915-2899
Original language: ENG
Citation databases: SCI-EXP, SSCI i/ili A&HCI
Current Contents Connect (CCC)
Scopus
Science Citation Index Expanded (SCI-EXP) (sastavni dio Web of Science Core Collectiona)
Category: Znanstveni
Research fields:
Graphic technology
URL: http://www.sciencedirect.com/science/journal/01694332
http://www.sciencedirect.com/science?_ob=MImg&_imagekey=B6THY-4TDK6NC-3-R&_cdi=5295&_user=3875467&_orig=browse&_coverDate=12%2F30%2F2008&_sk=997449994.7997&view=c&wchp=dGLzVtb-zSkWz&md5=e3280740d585c2f5ad448969d7cb60bf&ie=/sdarticle.pdf
Broj citata:
Altmetric:
DOI: 10.1016/j.apsusc2008.08.106
URL cjelovitog rada:
Google Scholar: Inferring fractal dimension of rough/porous surfaces - a comparison of SEM image analysis and electrochemical impedance spectroscopy methods
Contrib. to CROSBI by: mgojo@grf.hr (mgojo@grf.hr), 10. Ruj. 2008. u 15:59 sati



  Print version   za tiskati


upomoc
foot_4