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Small angle scattering of synchrotron radiation on nanosized CeO2 and CeO2-SnO2 thin films obtained by sol-gel dip-coating method

Nanosized CeO2, and CeO2-SnO2, 100 -500 nm thick, films on glass substrate were prepared using sol-gel dip-coating method procedure. The average grain size <R>, obtained by SAXS( small-angle X-ray scattering), varied with the number of dips for the CeO2-SnO2 samples. For the CeO2 films, obtained by dipping it 8 times, <R> increased compared to CeO2-SnO2 films, which were obtained by the same number of dips, from 4, 4 to 5, 3 nm. Specific surface areas of both these films were also determined and varied from 0.18x107 to 0.51x107 cm-1. SAXS measurements also revealed the layered structure of CeO2 and CeO2-SnO2 films.

SAXS; sol-gel; CeO2; CeO2-SnO2

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